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Paul K. Hurley

Institution

University College Cork

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Subjects

Physics

Details
Publications 78
As first author 1
As last author 17
Unique topics 392
Collaborations 99
Sources 5
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2016
2015
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2012
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2020
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2012
Earlier

2020

Investigating the transient response of Schottky barrier back-gated MoS2 transistors
2019

Demonstration of genuine surface inversion for the p/n-In0.3Ga0.7Sb-Al2O3 MOS system with in situ H2 plasma cleaning
2019

Detection of inhibitory effects in the generation of breakdown spots in HfO2-based MIM devices
2019

Effect of low temperature RF plasma treatment on electrical properties of junctionless InGaAs MOSFETs
2019

Effects of annealing temperature and ambient on Metal/PtSe2 contact alloy formation
2019

Investigating electrically active defect distributions in MOS structures based on inelastic tunneling interaction with border traps and a nonlocal model for interface traps
2019

Physics-based modelling of MoS2: the layered structure concept
2019

Quantum confinement-induced semimetal-to-semiconductor evolution in large-area ultra-thin PtSe2 films grown at 400 °C
2019

Relationship between capacitance and conductance in MOS capacitors
2018

AsH3 gas-phase ex situ doping 3D silicon structures
2018

Diagnosis of phosphorus monolayer doping in silicon based on nanowire electrical characterisation
2018

Dual-gate MoS2 transistors with sub-10 nm top-gate high-k dielectrics
2018

Evaluation of border traps and interface traps in HfO2/MoS2 gate stacks by capacitance - voltage analysis
2018

Growth of 1T ' MoTe2 by thermally assisted conversion of electrodeposited tellurium films
2018

Investigating positive oxide charge in the SiO2/3C-SiC MOS system
2018

Monolayer doping and other strategies in high surface-to-volume ratio silicon devices
2018

Monolithic integration of patterned BaTiO3 thin films on Ge wafers
2018

Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves
2018

Profiling border-traps by TCAD analysis of multifrequency CV-curves in Al2O3/InGaAs stacks
2018

Two-dimensional materials and their role in emerging electronic and photonic devices
2018

Wide Spectral Photoresponse of Layered Platinum Diselenide-Based Photodiodes.
2017

Electrical characterization of top-gated molybdenum disulfide field-effect-transistors with high-k dielectrics
2017

Examining the relationship between capacitance-voltage hysteresis and accumulation frequency dispersion in InGaAs metal-oxide-semiconductor structures based on the response to post-metal annealing
2017

Exploratory study and application of the angular wavelet analysis for assessing the spatial distribution of breakdown spots in Pt/HfO2/Pt structures
2017

First principles modeling of defects in the Al2O3/In0.53Ga0.47As system
2017

Improvement in top-gate MoS2 transistor performance due to high quality backside Al2O3 layer
2017

Influence of free radical surface activation on Si/SiC heterogeneous integration by direct wafer bonding
2017

Inversion in the In0.53Ga0.47As metal-oxide-semiconductor system: Impact of the In0.53Ga0.47As doping concentration
2017

Probing interface defects in top-gated MoS2 transistors with impedance spectroscopy
2017

Rhenium-doped MoS2 films
2017

Spatial analysis of failure sites in large area MIM capacitors using wavelets
2017

The impact of forming gas annealing on the electrical characteristics of sulfur passivated Al2O3/In0.53Ga0.47As (110) metal-oxide-semiconductor capacitors
2016

Air sensitivity of MoS2, MoSe2, MoTe2, HfS2 and HfSe2
2016

Back-gated Nb-doped MoS2 junctionless field-effect-transistors
2016

Band offsets and trap-related electron transitions at interfaces of (100)InAs with atomic-layer deposited Al2O3
2016

Design principles for maximizing photovoltage in metal-oxide-protected water-splitting photoanodes
2016

Engineering Interfacial Silicon Dioxide for Improved Metal-Insulator-Semiconductor Silicon Photoanode Water Splitting Performance.
2016

Isolating the Photovoltaic Junction: Atomic Layer Deposited TiO2-RuO2 Alloy Schottky Contacts for Silicon Photoanodes.
2016

Structural and electrical Investigation of MoS2 thin films formed by thermal assisted conversion of Mo metal
2015

Design principles for maximizing photovoltage in metal-oxide-protected water-splitting photoanodes.
2015

Multi-frequency inversion-charge pumping for charge separation and mobility analysis in high-k/InGaAs metal-oxide-semiconductor field-effect transistors
2014

A combined capacitance-voltage and hard x-ray photoelectron spectroscopy characterisation of metal/Al2O3/In0.53Ga0.47As capacitor structures
2014

Diffusion of In0.53Ga0.47As elements through hafnium oxide during post deposition annealing
2014

Electrical and physical characterization of the Al2O3/p-GaSb interface for 1%, 5%, 10%, and 22% (NH4)(2)S surface treatments
2014

Fermi level de-pinning of aluminium contacts to n-type germanium using thin atomic layer deposited layers
2013

An investigation of capacitance-voltage hysteresis in metal/high-k/In0.53Ga0.47As metal-oxide-semiconductor capacitors
2013

Analysis of the breakdown spot spatial distribution in Pt/HfO2/Pt capacitors using nearest neighbor statistics
2013

Chemical and electrical characterization of the HfO2/InAlAs interface
2013

Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0.53Ga 0.47As capacitors
2013

Nonhomogeneous spatial distribution of filamentary leakage current paths in circular area Pt/HfO2/Pt capacitors
2012

A combined hard x-ray photoelectron spectroscopy and electrical characterisation study of metal/SiO2/Si(100) metal-oxide-semiconductor structures
2012

Interface barriers at the interfaces of polar GaAs(111) faces with Al2O3
2012

Observation of peripheral charge induced low frequency capacitance-voltage behaviour in metal-oxide-semiconductor capacitors on Si and GaAs substrates
2011

A systematic study of (NH4)(2)S passivation (22%, 10%, 5%, or 1%) on the interface properties of the Al2O3/In0.53Ga0.47As/InP system for n-type and p-type In0.53Ga0.47As epitaxial layers
2011

Analysis of effective mobility and hall effect mobility in high-k based In0.75Ga0.25As metal-oxide-semiconductor high-electron-mobility transistors
2011

Analysis of the minority carrier response of n-type and p-type Au/Ni/Al2O3/In0.53Ga0.47As/InP capacitors following an optimized (NH4)(2)S treatment
2011

Calculation of the capacitance-voltage characteristic of GaAs, In0.53Ga0.47As, and InAs metal-oxide-semiconductor structures
2011

In-situ characterization of Ga2O passivation of In0.53Ga0.47As prior to high-k dielectric atomic layer deposition
2011

On the calculation of effective electric field in In0.53Ga0.47As surface channel metal-oxide-semiconductor field-effect-transistors
2010

Electron band alignment between (100)InP and atomic-layer deposited Al2O3
2010

Electron energy band alignment at the (100)Si/MgO interface
2010

Modeling the capacitance-voltage response of In0.53Ga0.47As metal-oxide-semiconductor structures: Charge quantization and nonparabolic corrections
2010

Multi-technique characterisation of MOVPE-grown GaAs on Si
2010

Origin and passivation of fixed charge in atomic layer deposited aluminum oxide gate insulators on chemically treated InGaAs substrates
2010

Structural and electrical analysis of the atomic layer deposition of HfO2/n-In0.53Ga0.47As capacitors with and without an Al2O3 interface control layer
2009

Analysis of electron mobility in HfO2/TiN gate metal-oxide-semiconductor field effect transistors: The influence of HfO2 thickness, temperature, and oxide charge
2009

Electrical characterization of the soft breakdown failure mode in MgO layers
2009

Energy barriers at interfaces between (100) InxGa1-xAs (0 <= x <= 0.53) and atomic-layer deposited Al2O3 and HfO2
2009

Structural analysis, elemental profiling, and electrical characterization of HfO2 thin films deposited on In0.53Ga0.47As surfaces by atomic layer deposition
2009

Temperature and frequency dependent electrical characterization of HfO2/InxGa1-xAs interfaces using capacitance-voltage and conductance methods
2008

Electrical, structural, and chemical properties of HfO₂ films formed by electron beam evaporation
2008

Energy barriers at interfaces of (100)GaAs with atomic layer deposited Al2O3 and HfO2
2008

Energy state distributions of the P(b) centers at the (100), (110), and (111) Si/SiO(2) interfaces investigated by Laplace deep level transient spectroscopy
2008

Facile and controlled synthesis of ultra-thin low dielectric constant meso/microporous silica films.
2008

In situ H(2)S passivation of In(0.53)Ga(0.47)As/InP metal-oxide-semiconductor capacitors with atomic-layer deposited HfO(2) gate dielectric
2003

Analysis of P-b centers at the Si(111)/SiO2 interface following rapid thermal annealing
2002

Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes
2001

Si(100)-SiO2 interface properties following rapid thermal processing

These arethe5 unique sources for Paul K. Hurley's 78 publications. A single publication may appear in multiple sources. Click on a name or publication count to see the publications for a particular source.

Source #
Ireland -> Dublin City University 3
Ireland -> Trinity College Dublin 1
Ireland -> Trinity College Dublin -> PubMed 1
Ireland -> University College Cork 77
Ireland -> University College Cork -> PubMed 4

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