Journal Article


Simon B. Newcomb
David Sutton
M. Serantoni
D. Noel Buckley
Colm O'Dwyer



transmission electron microscopy silicon porous layer formation porous materials cyclic voltammetry cyclic voltammograms pit formation photonic crystals atomic force microscopy

Pitting and porous layer formation on n-InP anodes (2003)

Abstract Surface pitting occurs when InP electrodes are anodized in KOH electrolytes at concentrations in the range 2 - 5 mol dm-3. The process has been investigated using atomic force microscopy (AFM) and the results correlated with cross-sectional transmission electron microscopy (TEM) and electroanalytical measurements. AFM measurements show that pitting of the surface occurs and the density of pits is observed to increase with time under both potentiodynamic and potentiostatic conditions. This indicates a progressive pit nucleation process and implies that the development of porous domains beneath the surface is also progressive in nature. Evidence for this is seen in plan view TEM images in which individual domains are seen to be at different stages of development. Analysis of the cyclic voltammograms of InP electrodes in 5 mol dm-3 KOH indicates that, above a critical potential for pit formation, the anodic current is predominantly time dependent and there is little differential dependence of the current on potential. Thus, pores continue to grow with time when the potential is high enough to maintain depletion layer breakdown conditions.
Collections Ireland -> University College Cork -> College of Science, Engineering and Food Science
Ireland -> University College Cork -> Chemistry - Conference Items
Ireland -> University College Cork -> Chemistry

Full list of authors on original publication

Simon B. Newcomb, David Sutton, M. Serantoni, D. Noel Buckley, Colm O'Dwyer

Experts in our system

D. Noel Buckley
University College Cork
Total Publications: 27
Colm O'Dwyer
University College Cork
Total Publications: 121